Bipolar transistors

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ESD protection, TVS, filtering and signal conditioning

MOSFETs

SiC MOSFETs

GaN FETs

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Analog & Logic ICs

Automotive qualified products (AEC-Q100/Q101)

74AHC594DB-Q100

8-bit shift register with output register

The 74AHC594-Q100; 74AHCT594-Q100 is a high-speed Si-gate CMOS device and is pin compatible with Low-Power Schottky TTL (LSTTL). It is specified in compliance with JEDEC standard No. 7-A.

The 74AHC594-Q100; 74AHCT594-Q100 is an 8-bit, non-inverting, serial-in, parallel-out shift register that feeds an 8-bit D-type storage register. Separate clocks (SHCP and STCP) and direct overriding clears (SHR and STR) are provided on both the shift and storage registers. A serial output (Q7S) is provided for cascading purposes.

Both the shift and storage register clocks are positive-edge triggered. If the user wishes to connect both clocks together, the shift register will always be one count pulse ahead of the storage register.

This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.

This product has been discontinued

Features and benefits

  • Automotive product qualification in accordance with AEC-Q100 (Grade 1)

    • Specified from -40 °C to +85 °C and from -40 °C to +125 °C

  • Wide supply voltage range from 2.0 V to 5.5 V

  • Balanced propagation delays

  • All inputs have Schmitt-trigger action

  • Overvoltage tolerant inputs to 5.5 V

  • High noise immunity

  • CMOS low power dissipation

  • 8-bit serial-in, parallel-out shift register with storage

  • Independent direct overriding clears on shift and storage registers

  • Independent clocks for shift and storage registers

  • Latch-up performance exceeds 100 mA per JESD 78 Class II Level A

  • Input levels:

    • For 74AHC594-Q100: CMOS level

    • For 74AHCT594-Q100: TTL level

  • ESD protection:

    • HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V

    • CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V

  • Multiple package options

  • DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints

Applications

  • Serial-to parallel data conversion

  • Remote control holding register

Parametrics

Type number Package name
74AHC594DB-Q100 SSOP16

Package

All type numbers in the table below are discontinued.

Type number Orderable part number, (Ordering code (12NC)) Status Marking Package Package information Reflow-/Wave soldering Packing
74AHC594DB-Q100 74AHC594DB-Q100J
(935302542118)
Obsolete AHC594 SOT338-1
SSOP16
(SOT338-1)
SOT338-1 SSOP-TSSOP-VSO-REFLOW
SSOP-TSSOP-VSO-WAVE
Not available

Environmental information

All type numbers in the table below are discontinued.

Type number Orderable part number Chemical content RoHS RHF-indicator
74AHC594DB-Q100 74AHC594DB-Q100J 74AHC594DB-Q100 rohs rhf rhf
Quality and reliability disclaimer

Documentation (8)

File name Title Type Date
74AHC_AHCT594_Q100 8-bit shift register with output register Data sheet 2024-03-07
AN11106 Pin FMEA for AHC/AHCT family Application note 2019-01-09
ahc594 ahc594 IBIS model IBIS model 2013-04-08
Nexperia_package_poster Nexperia package poster Leaflet 2020-05-15
SSOP16_SOT338-1_mk plastic, shrink small outline package; 16 leads; 0.65 mm pitch; 6.2 mm x 5.3 mm x 2 mm body Marcom graphics 2017-01-28
SOT338-1 plastic, shrink small outline package; 16 leads; 0.65 mm pitch; 6.2 mm x 5.3 mm x 2 mm body Package information 2022-06-20
SSOP-TSSOP-VSO-REFLOW Footprint for reflow soldering Reflow soldering 2009-10-08
SSOP-TSSOP-VSO-WAVE Footprint for wave soldering Wave soldering 2009-10-08

Support

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Models

File name Title Type Date
ahc594 ahc594 IBIS model IBIS model 2013-04-08

How does it work?

The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.